Twin DFT and Mission-Critical Safety Apps for Pre-Silicon Design Verification
Combining these Apps with an emulation environment makes it possible to increase fault coverage, increase production yield, and reduce ATE test time and cost Source: ElectronicDesign Lauro Rizzatti | Dec 19, 2018 The design-for-test (DFT) technology was driven by the need to harness the runaway cost of testing silicon chips on the manufacturing floor. This phenomenon eventually … Read more